WOLFRAM NOTEBOOK

WOLFRAM|DEMONSTRATIONS PROJECT

Nomogram of p and s Reflectances for an Ambient-Film-Substrate System

film refractive index

normalized film thickness

The experimental setup consists of an ambient-film-substrate system. Linearly polarized light is incident at an angle

from air onto a silicon substrate coated with a film of refractive index

and normalized thickness

. The reflectances for the

and

polarizations are measured and are verified with the theoretical results from the nomogram.

The figure shows a nomogram that relates

and

intensity reflectances at an angle of incidence

=70°

to a varying coating refractive index

and the normalized thickness

. The reflectances for both polarizations can be read off the axes for any given value of the refractive index and thickness of the film at

=70°

. Similar nomograms for other material systems at any angle of incidence can be generated.

You are using a browser not supported by the Wolfram Cloud

Supported browsers include recent versions of Chrome, Edge, Firefox and Safari.

I understand and wish to continue anyway »